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.高光学测量距离与物体目标比(D:S=16:1~50:1)

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.高光学测量距离与物体目标比(D:S=16:1~50:1)

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高清晰度、高灵敏度的伪彩图像方式呈现在您的面前;

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对任何目标物体进行温度测量的仪表修正对光线的反射影响

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结构精致、坚固耐用、测量精准、良好的环境适应性

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适应在负责的天气条件下经行的中远距离、超远距离的探测和监控

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用于测量那些不适合使用传统接触式测量方法来测量物体的表面温度

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种测量模式可选择 额头温度测量:35.0~42.0°C 一般红外测量:0~100.0 °C

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-32~760℃ (-25~1400oF) 可选择 ℃ / ℉单位 背光显示 雷射指示测量位置

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可选择 ℃ / ℉单位 背光显示,雷射指示测量位置

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可选择℃/℉单位 背光显示 镭射指示测量位置 量程: -35.0~630.0°C MAX/MIN/AVG

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测量范围-32~535℃ 可选择 ℃ / ℉单位 背光显示 雷射指示测量位置

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测量范围-32~535℃ 可选择 ℃ / ℉单位 背光显示

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Showing 1–3 of 60 results